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Nederland – Elektronenmicroscopen – Dual‑beam FIB/SEM system

Awarded Contract award No deadline published

Description

Aankoop van een dual-beam FIB/SEM systeem Aankoop van één (1) dual-beam FIB/SEM systeem

Official source

Source: TED — Tenders Electronic Daily (Publications Office of the EU)

Always verify details on the official notice.

View the official notice

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