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Hrvatska – Pretraživački elektronski mikroskopi – Pretražni elektronski mikroskop s izvorom elektrona emisijom iz polja (FEG-SEM)

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Description

Uređaj (s FEG izvorom) za pretražnu elektronsku mikroskopijsku analizu. Omogućuje morfološku, faznu, kemijsku i strukturnu analizu uzoraka visoke rezolucije.

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