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België – Laboratoriuminstrumenten, optische en precisie-instrumenten (uitgezonderd brillen) – WAFER-COMPATIBELE PLASMA GEFOCUSTE IONENBUNDEL-SCANNING ELEKTRONENMICROSCOOP (PFIB-SEM) SYSTEEM

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Description

WAFER-COMPATIBELE PLASMA GEFOCUSTE IONENBUNDEL-SCANNING ELEKTRONENMICROSCOOP (PFIB-SEM) SYSTEEM

Official source

Source: TED - Tenders Electronic Daily (Publications Office of the EU)

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Key facts

Buyer: Imec EU Pilot line NV
Country: Belgium · BE242
Published: 4 Jun 2026
Procedure: Negotiated procedure; EU-wide (above threshold)
Original language: nl
CPV codes: 38000000