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Switzerland – Scanning probe microscopes – Low-temperature scanning probe microscope for in-operando device nanoscopy

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Descrizione

The subject of this tender is a low-temperature (<3K), ultrahigh vacuum (UHV) scanning probe microscopy system with optical access to the scanned sample to pinpoint device structures in the sub-micrometer range to be investigated on the atomic level. The system provides state-of-the-art scanning tunneling microscopy (STM), spectroscopy (STS) and tuning fork based noncontact atomic force microscopy (nc-AFM), including UHV preparation chamber and load lock.

Fonte ufficiale

Fonte: TED — Tenders Electronic Daily (Publications Office of the EU)

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